Westfield, Ind.-based Insects Limited hosted its 14th Stored Product Protection Conference on the Purdue University campus in West Lafayette, Ind. The event, which took place June 13-14, was attended by industry experts, researchers and pest management professionals to discuss the latest trends and innovations in stored product protection. Attendees had the opportunity to network with peers and learn about the latest developments in the field.
“By bringing together leading experts in the field, we hope to inspire and empower attendees to take their pest management strategies to the next level,” said Tom Mueller, VP of Insects Limited and son of company and conference founder and Pest Management Professional Hall of Famer (Class of 2019) David Mueller, BCE.
The Insects Limited team hopes to resume its biannual schedule for the next conference. Location, date and additional details will soon be made available at InsectsLimited.com.
Multinational Gathering
Attendees from around the world attended the conference. Behind the group is Purdue University’s Beck Agricultural Center, where the conference lectures took place.
A Family Affair
From left are Pete Mueller, president of Fumigation Service & Supply (FSS); Tom Mueller, vice president of Insects Limited; Pat Kelley, president of Insects Limited; Sebastian Barributsa of Inoqua, an Insects Limited distributor in Argentina; and Dave Mueller, BCE — the father of Pete and Tom and the founder of both FSS and Insects Limited, as well as the conference itself.
Food Experiment
Conference attendees visit a food tasting room during a tour of Purdue University’s Philip E. Nelson Hall of Food Science. Volunteers who taste and give feedback on different foods sit at the booths and the food is passed through to them through a sliding door in the wall. The red coloration removes any visual stimulation from the food, leaving only the taste to make an impression.
Pest-free Grain
Dr. Klein Ileleji, a Purdue University professor and extension engineer, shows an experimental grain probe used to detect insects in grain during a demonstration given at the Purdue University Agronomy Center for Research and Education.
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